On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges
نویسندگان
چکیده
منابع مشابه
Surface Characterization of Viscoelastic Materials through Spectral Intermittent Contact Atomic Force Microscopy
Title of Document: SURFACE CHARACTERIZATION OF VISCOELASTIC MATERIALS THROUGH SPECTRAL INTERMITTENT CONTACT ATOMIC FORCE MICROSCOPY Jeffrey Charles Williams, Master of Science, 2012 Directed By: Assistant Professor Santiago Solares Department of Mechanical Engineering The ability to recover material properties at the atomic scale has been the ongoing objective of the Atomic Force Microscope (AF...
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In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...
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True atomic resolution in vacuum with a force microscope is now obtained routinely by using the frequency shift of an oscillating cantilever as the imaging signal. Here, a calculation is presented that relates the frequency shift to the forces between tip and sample for both large and small oscillation amplitudes. Also, the frequency versus distance data for van der Waals dominated tip-sample i...
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Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale topography as well as mechanical properties. Nevert...
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2020
ISSN: 2190-4286
DOI: 10.3762/bjnano.11.125